Course Title | Code | Semester | L+U Hour | Credits | ECTS |
---|---|---|---|---|---|
Electronics | CE203 | 3. Semester | 3 + 2 | 4.0 | 5.0 |
Prerequisites | None |
Language of Instruction | English |
Course Level | Undergraduate |
Course Type | |
Mode of delivery | Face-to-Face |
Course Coordinator |
Assoc. Prof. Dr. Muhammed Enes BAYRAKDAR |
Instructors |
Muhammed Enes BAYRAKDAR |
Assistants | |
Goals | To recognize semiconductor circuit elements and to learn and analyze where their circuits are used, to simulate these circuits by using package programs such as workbench, and to implement these circuits in a laboratory environment and learn to make measurements. |
Course Content | 1) Learning diode biasing and operation of diode circuits. 2) Learning the operation and purpose of use of Zener diode circuits. 3) Learning the polarity, operation and purpose of use of BJTs. 4) Learning variable signal analysis of BJTs. 5) Learning the polarization, operation and usage purpose of FETs. 6) Learning the operation and purpose of OPAMPs. |
Learning Outcomes |
- Learning diode biasing and operation of diode circuits. - Learning the operation and purpose of use of zener diode circuits. - Learning the use of diodes as rectifiers and clippers. - Learning about the polarization, operation, and intended use of BJTs. - Learning variable signal analysis of BJTs. - Learning the polarization and operation of FETs and their intended use. |
Week | Topics | Learning Methods |
---|---|---|
1. Week | Introduction to the semiconductors | |
2. Week | Introduction and Basic Concepts, Introduction to Electrical Circuits, Theorems | |
3. Week | Electronics Applications & Diodes | |
4. Week | Diode Applications | |
5. Week | Diode Applications & Special Diodes | |
6. Week | Transistors | |
7. Week | BJT Review | |
8. Week | BJT Circuit | |
9. Week | BJT Biasing Circuits | |
10. Week | BJT Transistors & DC Biasing | |
11. Week | BJT Low Frequency Response | |
12. Week | BJT AC Analysis | |
13. Week | BJT Modeling and (re) Transistor Model (Small Signal Analysis) | |
14. Week | FET, DC Analysis of FET, FET Biasing, JFET |
Boylestad R. and Nashelsky L., Electronic Devices and Circuit Theory, Prentice Hall, 2013. |
Salivahanan, S., & Kumar, N. S. Electronic Circuits I. McGraw-Hill Education, 2018. |
Floyd, T. L. Electronic Devices, Global Edition. Pearson Education Limited, 2017. |
Program Requirements | Contribution Level | DK1 | DK2 | DK3 | DK4 | DK5 | DK6 | Measurement Method |
---|
0 | 1 | 2 | 3 | 4 | 5 | |
---|---|---|---|---|---|---|
Course's Level of contribution | None | Very Low | Low | Fair | High | Very High |
Method of assessment/evaluation | Written exam | Oral Exams | Assignment/Project | Laboratory work | Presentation/Seminar |