Course Information

Course Information
Course Title Code Language Type Semester L+U Hour Credits ECTS
Electrical Characterization Methods FIZ727 Turkish Compulsory 3 + 0 3.0 7.5
Prerequisite Courses
Course Level Graduate
Mode of delivery Lecturing
Course Coordinator Prof. Dr. Oğuz KÖYSAL
Instructor(s)
Goals Making characterization of microelectronic devices diode containing solid and liquid semiconductors, transistor etc. by current-voltage and admittance method
Course Content Classification of solids and energy-band theory,Crystal mesh,Intrinsict semiconductor crystals,Energy-band structure,Charge carrier densities at thermal equilibrium,Intrinsict and doped semiconductors,Schottky diodes, Metal-insulator-semiconductor (MIS/MOS/MPS) structures. Schottky diodes,Current-voltage characteristics,Admittance technique and characterization
Lesson Plan (Weekly Topics)
Week Topics/Applications Method
1. Week Classification of solids and energy-band theory.
2. Week Classification of solids and energy-band theory.
3. Week Crystal mesh.
4. Week Intrinsict semiconductor crystals.
5. Week Energy-band structure.
6. Week Energy-band structure.
7. Week Charge carrier densities at thermal equilibrium.
8. Week MIDTERM EXAM
9. Week Intrinsict and doped semiconductors.
10. Week Schottky diodes, Metal-insulator-semiconductor (MIS/MOS/MPS) structures.
11. Week Schottky diodes, Metal-insulator-semiconductor (MIS/MOS/MPS) structures.
12. Week Current-voltage characteristics.
13. Week Current-voltage characteristics.
14. Week Admittance technique and characterization
*Midterm and final exam dates are not specified in the 14-week course operation plan. Midterm and final exam dates are held on the dates specified in the academic calendar with the decision of the University Senate.
Recommended Sources
Ders Kitabı veya Notu Ders Kitabı veya Ders Notu bulunmamaktadır.
Diğer Kaynaklar
  • • S.M. Sze, K.K. Ng., Physics of Semiconductor Devices, 3nd Edition, Wiley, 2007.