Education Information System | Duzce University

Course Title	Code	Semester	L+U Hour	Credits	ECTS
Crystal Growth Techniques	FIZ730		3 + 0	3.0	7.5

Prerequisites	None

Language of Instruction	Turkish
Course Level	Graduate
Course Type
Mode of delivery	Lecturing
Course Coordinator	Prof. Dr. Kadir GÖKŞEN
Instructor(s)
Assistants
Goals	To teach growth techniques and the principles of the bulk and thin-film crystals and the internal measurement techniques.
Course Content	Development of crystal growth,Growth of liquid phase,Silicon and GaAs growth methods,Czochralski and Brigman techniques,Epitaxial growth, Ultra-high vacuum conditions and techniques,Kinetic Theory of Gases,Chemical vapor deposition/epitaxy (CVD),Epitaxy Metalorganik chemical vapor (MOCVD) techniques,Molecular beam Epitaxy (MBE),Internal measurement techniques: RHEED, AES and the ellipsometer, the mass spectrometer
Learning Outcomes

Week	Topics	Learning Methods
1. Week	Development of crystal growth.
1. Week	Development of crystal growth.
2. Week	Growth of liquid phase.
2. Week	Growth of liquid phase.
3. Week	Silicon and GaAs growth methods.
3. Week	Silicon and GaAs growth methods.
4. Week	Czochralski and Brigman techniques.
4. Week	Czochralski and Brigman techniques.
5. Week	Czochralski and Brigman techniques.
5. Week	Czochralski and Brigman techniques.
6. Week	Epitaxial growth.
6. Week	Epitaxial growth.
7. Week	Epitaxial growth, Ultra-high vacuum conditions and techniques.
7. Week	Epitaxial growth, Ultra-high vacuum conditions and techniques.
8. Week	MIDTERM EXAM
8. Week	MIDTERM EXAM
9. Week	Kinetic Theory of Gases.
9. Week	Kinetic Theory of Gases.
10. Week	Chemical vapor deposition/epitaxy (CVD).
10. Week	Chemical vapor deposition/epitaxy (CVD).
11. Week	Epitaxy Metalorganik chemical vapor (MOCVD) techniques.
11. Week	Epitaxy Metalorganik chemical vapor (MOCVD) techniques.
12. Week	Molecular beam Epitaxy (MBE).
12. Week	Molecular beam Epitaxy (MBE).
13. Week	Molecular beam Epitaxy (MBE).
13. Week	Molecular beam Epitaxy (MBE).
14. Week	Internal measurement techniques: RHEED, AES and the ellipsometer, the mass spectrometer
14. Week	Internal measurement techniques: RHEED, AES and the ellipsometer, the mass spectrometer

• H.J.Scheel, T. Fukuda, Crsystal Growth Technology, Wiley, 2004. • G. Dhanaraj, K. Byrappa, V. Prasad, M. Dudley, Springer Handbook of Crystal Growth, Springer, 2009.
• H.J.Scheel, T. Fukuda, Crsystal Growth Technology, Wiley, 2004. • G. Dhanaraj, K. Byrappa, V. Prasad, M. Dudley, Springer Handbook of Crystal Growth, Springer, 2009.