| Course Title | Code | Semester | L+U Hour | Credits | ECTS |
|---|---|---|---|---|---|
| Measurement Techniques For Semiconductor Thin Films | FIZ723 | 3 + 0 | 3.0 | 7.5 |
| Prerequisites | None |
| Language of Instruction | Turkish |
| Course Level | Graduate |
| Course Type | |
| Mode of delivery | Lecturing |
| Course Coordinator |
Prof. Dr. Oğuz KÖYSAL |
| Instructors | |
| Assistants | |
| Goals | Supporting the informations of basic solid state physics |
| Course Content | X-ray Diffraction Techniques,Reflective High Energy Electron Diffraction (RHEED),Low Energy Electron Diffraction (LEED),Hall Effect,Raman Scattering,Infrared Measurements. |
| Learning Outcomes |
| Week | Topics | Learning Methods |
|---|---|---|
| 1. Week | X-ray Diffraction Techniques. | Verbal Expression |
| 2. Week | X-ray Diffraction Techniques. | Verbal Expression |
| 3. Week | X-ray Diffraction Techniques. | Verbal Expression |
| 4. Week | Reflective High Energy Electron Diffraction (RHEED). | Verbal Expression |
| 5. Week | Reflective High Energy Electron Diffraction (RHEED). | Verbal Expression |
| 6. Week | Reflective High Energy Electron Diffraction (RHEED). | Verbal Expression |
| 7. Week | Low Energy Electron Diffraction (LEED). | Verbal Expression |
| 8. Week | MIDTERM EXAM | |
| 9. Week | Low Energy Electron Diffraction (LEED). | Verbal Expression |
| 10. Week | Hall Effect. | Verbal Expression |
| 11. Week | Hall Effect. | Verbal Expression |
| 12. Week | Raman Scattering. | Verbal Expression |
| 13. Week | Raman Scattering. | Verbal Expression |
| 14. Week | Infrared Measurements. | Verbal Expression |
| • G. Bauer, W. Ricther, Optical Characterization of Epitaxial Semiconductor Layers, Springer-Verlag, 1996. • S. Perkowitz, Optical Characterization of Semiconductor, Academic Press Limited, 1993. |
| • G. Bauer, W. Ricther, Optical Characterization of Epitaxial Semiconductor Layers, Springer-Verlag, 1996. • S. Perkowitz, Optical Characterization of Semiconductor, Academic Press Limited, 1993. |
| Program Requirements | Contribution Level | Measurement Method |
|---|---|---|
| PY1 | 5 | 40,60 |
| PY2 | 4 | 40,60 |
| PY3 | 5 | 40,60 |
| PY4 | 5 | 40,60 |
| PY5 | 4 | 40,60 |
| PY6 | 4 | 40,60 |
| PY7 | 4 | 40,60 |
| PY8 | 4 | 40,60 |
| PY9 | 5 | 40,60 |
| PY10 | 4 | 40,60 |
| 0 | 1 | 2 | 3 | 4 | 5 | |
|---|---|---|---|---|---|---|
| Course's Level of contribution | None | Very Low | Low | Fair | High | Very High |
| Method of assessment/evaluation | Written exam | Oral Exams | Assignment/Project | Laboratory work | Presentation/Seminar |
| Event | Quantity | Duration (Hour) | Total Workload (Hour) |
|---|---|---|---|
| Course Hours | 14 | 3 | 42 |
| Preparation, After Class Study | 14 | 3 | 42 |
| Research | 14 | 3 | 42 |
| Verbal Expression | 14 | 1 | 14 |
| Visual Presentation | 14 | 1 | 14 |
| Midterm 1 | 1 | 2 | 2 |
| Homework 1 | 1 | 4 | 4 |
| Final | 1 | 2 | 2 |
| Classroom Activities | 14 | 3 | 42 |
| Total Workload | 204 | ||
| ECTS Credit of the Course | 7.5 | ||
